X-FAB introduces highly-sensitive SPAD and APD devices

  

Based on the company’s180nm high-voltage XH018 process, these function block devices deliver a combination of elevated performance parameters and straightforward integration.

The APD has a strong linear gain figure, and is fully scalable - going from just ten to several hundred micrometer dimensions. The proprietary X-FAB quenching circuit used in the SPAD results in a dead time of less than 15ns - thereby supporting high bandwidth. In addition, its low dark count rate (<100 counts/s/µm²) means that it is far less susceptible to thermal noise. The high photon detection probability (PDP) of the SPAD ensures that a much higher proportion of incident photons trigger an avalanche, and this is maintained across an extensive range of wavelengths (e.g. 40% at 400nm).

The X-FAB APD and SPAD can be utilised in a broad spectrum of different applications - including proximity sensing, LiDAR, time of flight (ToF), medical imaging (CT and PET) and scientific research.

Being AEC-Q100 compliant, they are suitable for deployment within automotive systems. Furthermore, the low breakdown voltage (<20V) that has been achieved facilitates their incorporation onto customer dies.

As integral parts of the X-FAB design kit, they are fully characterised, and can easily be combined with other modules featured in the XH018 process. Models for optical and electrical simulation, along with a specific application note, will help designers to integrate these devices into their circuitry within a short time period.

As well as being supplied in a function block format, a quenching reference circuit that fully demonstrates the capabilities of the SPAD is also available.