The webinar was well-received - but in case you missed it, or wish to listen again, it is available on-demand.
About the seminar
Lester discusses how high performance embedded JTAG solutions can provide an alternative PCBA and system test approach for limited or problematic physical access, dynamic memory test, high speed interface test, mixed-signal test and in-system programming, at-speed. By the end of the session, designers will be better equipped to solve problems associated with physical access and no-trouble-found (NTF) syndrome.
This type of testing solution should also reduce dependency on expensive test equipment, fixtures, and time-consuming test program development.
To listen to the seminar, click here. You will be asked to register or, if you have an account already, sign in, after which the seminar session will appear on screen.
