A modern alternative to struggling and costly traditional test methods - GOEPEL Electronics webinar

On May 23, 2018 GOEPEL Electronics, Application Engineer, Lester Tseng, will be discussing the ins and outs of embedded JTAG solutions – a modern alternative to costly and complex testing methods – in an expert webinar session hosted by New Electronics.

High performance Embedded JTAG Solutions provide PCBA and system test approaches for limited or problematic physical access, dynamic memory test, high speed interface test, mixed-signal test and in-system programming, at-speed. By the end of the session, designers will be better equipped to solve problems associated with physical access and no-trouble-found (NTF) syndrome.

This type of testing solution should also reduce dependency on expensive test equipment, fixtures, and time-consuming test program development.

The webinar, which will take place at 15:00 BST, will aim to introduce the delegates to Embedded JTAG Solutions, and explain how to get started with this type of testing. This will include design-for-test requirements and ease-of-use provided by pre-existing models and automatic test program generation.

The session will cover the following:

• Well-defined DFT requirements to guide testability of the design
• Reducing the engineering resources required for test program development
• Addressing ever increasing challenges related to component access by testing PCBA assembly integrity from the inside out
• Enabling utilisation of technology already on the PCBA for high performance functional/mixed signal test and in-system programming
• Reducing dependency on high-cost test equipment and fixtures

The webinar will also outline the advantage of easier and less costly test methods, offering a range of high performance alternatives. A Q&A session will follow.

For more information and to register, click here.